| Facility | BL | X-ray Energy | Energy Resolution | Photon Flux | Beam Size at Sample | Diffractometer/Detector | Sample Conditions |
|---|---|---|---|---|---|---|---|
| PF | BL-1A | 5-20keV | dE/E ∼ 5 ~ 10-4 | IP(Rigaku)/7-axis(Huber with Ge(111), Graphite(002), Cu(110) analyzers) | N2 gal cooling | ||
| BL-1B | 6-21keV | dE/E ∼ 3 ~ 10-4 | 0.3mm(V) ~ 0.5mm(H) | Micro Powder Diffractometer (Mac Science) + IP | Low temperature with JT-type cryostat, high pressure with DAC | ||
| BL-3A | White or 6-20keV | dE/E ∼ 2 ~ 10-4 | 100mm ~ 5mm (non-focusing) 2mm ~ 1mm (focusing) |
Triple-axis, four-circle diffractometer | Liq. He cryostat, high temperature oven, powder | ||
| BL-4B1 | Micro diffraction | ||||||
| BL-4B2 | 6-20keV | dE/E ∼ 2 ~ 10-4 | 13mm(H) ~ 2mm(V) | ½Aoνwό²ράu | ½ΒΏz_[@ROΣ~ODQ`ODW(d) ι’ΝsΜKXz_[, Ls[ | ||
| BL-4C | 6-21keV | dE/E ∼ 3 ~ 10-4 | 0.3mm(V) ~ 0.5mm(H) | HUBER 5020, polarization analyzer, scintillation counter | |||
| BL-10A | 5-25keV | dE/E = 10-3 ∼ 5 ~ 10-4 | Al2O3150ΚmΣP»ΜΕubO½ΛS.C.ΜͺθΕ ∼ 107cps | 0.05mmΣ`1mmΣ | Vertical four-axis diffractometer | N2 gas for lowtemperature and high temperature | |
| BL-13B2 | 20-40keV | dE/E = 4 ~ 10-4 | MAX90 | for High-temperature, hig-pressure exp. | |||
| BL-14A | 5-80keV | dE/E = 2 ~ 10-4 Si(111) | 2mm(H) ~ 1mm(V)mm (with focusing mirror), 5mm(H) ~ 35mm(V)(max.) | Horizontal 4-axis diffractometer, NaI, APD, Gas Ionization Chamber | co-use with XAFS exp. | ||
| BL-14C | 7-66keV, white | 60eV/33keV (Si(111)) | ∼ 108 photons/mm2/s (33keV) | 38mm(V) ~ 8mm(H)mm | High-temperature, high-pressure | ||
| BL-15B1 | X-ray Magnetic Scattering | ||||||
| BL-15B2 | Fast Surface X-ray Diffraction | ||||||
| BL-15C | 4-20keV | 4eV at 10keV (Si(111)) | 70 mm (H) ~ 10 mm (V) | Horizontal multi-axis precise diffractometer | |||
| BL-16A2 | 6-axis diffractometer, polarization analyzer, SSD | N2 gas cooler | |||||
| BL-18C | 6-25keV, white | dE/E ∼ 5 ~ 10-4 | vertical focusing 40Κm (divergence 1mrad), horizontal focusing 85Κm (divergence 0.8mrad) @ 20.0m | High-pressure powder diffraction (room temperature), IP, X-ray CCD | Diamond Anvil Cell (DXR-GM gas driven DAC), LTS-22 Cryostat | ||
| BL-27B | 4-20keV | dE/E ∼ 10-4 | 40mm(H) ~ 6mm(V) (non focused) | 40kR/min at 10keV (Bio-irradiation) | 9-axis diffractometor | for radio active samples | |
| AR (PF) | AR-NE1A1 | Magnetic/High Resolution Compton Scattering | |||||
| AR-NE5C | 20`140keV(white), 30-80keV(monochromatize) | dE/E ∼ 5~10-4 | 60mm(W) ~ 6mm(H) | MAX80 | High Temperature, High Pressure | ||
| SPring-8 | BL02B1 | 5-115keV | dE/E ∼ 10-4 | 1010photons/sec | 1mm(H) ~ 1mm(V) | 7-circle diffractometer, low temparature vacuum camera | Single Crystal Structure Analysis, 20 ∼ 300K (vacuum camera) |
| BL02B2 | 12-35keV | dE/E ∼ 2 ~ 10-4 (Si(111)) | 1011photons/sec | Large Debye-Scherrer camera (R=286.5mm, 2theta range ∼ 75degrees), IP | Powder Diffraction, 15 ∼ 300K (cryostat), 90-1000K (N2 gas flow) | ||
| BL04B1 | 10-150keV(white) | 0.05 ~ 0.05 ∼ 10 ~ 10 mm2 | Speed 1500, SPEED-Mk.II | High Pressure Mineral Physics | |||
| BL04B2 | Si 111 : 37.8 keV, Si 220 : 61.7 keV | dE/E = 10-3 @15 m from the monochromator (at the incident beam size : 0.2mm(H) ~ 4mm(W)) | 37.8 keV Flat : 2.2 ~ 1010 (photons/sec/(1mm ~ 1mm) @100 mA), Bent (at focus point) : 7.1 ~ 1011, 61.7 keV Flat : 3.4 ~ 109, Bent (at focus point) : 9.2 ~ 1010 | 37.8 keV : 0.220 mm, 61.7 keV: 0.375 mm (at the incident beam size : 0.2mm(H) ~ 4mm(W)) | Two-axis diffrractometer, Weissenberg camera, IP | X-ray Scatering exp. for Disordered materials, Diamond Anvil Cell for high pressure physics, Small Angle Scattering | |
| BL08W | 150keV, 300keV | High Resolution Compton Scattering Spectrometer | Magnetic/High Energy Compton Scattering | ||||
| BL10XU | 6 ∼ 35 keV | ’E/E ∼ 10-4 | ’E/E ∼ 10-4 | ∼ 0.5 ~ 1.0 mm2 | High-Pressure X-ray Diffraction using DAC | ||
| BL11XU | 6 ∼ 70 keV | X-raydiffractometer for surface sciences | MBE chamber, RHEED | ||||
| BL12XU | 4.6 ∼ 75 keV | After Si(111) Double Crystal Monochromator : 1.4 ~ 10-4, After High Resolution Monochromator : 10-5 ∼ 10-7 (optics dependent) | After Si(111) DCM: ∼ 1010 photons/sec/meV below 26 keV, at sample: optics dependent | 0.120mm(H) ~ 0.075mm(V) | HUBER 8-circle diffractometer for high Q-resolution scattering, Custom-built 3m arm triple axes spectrometer for Inelastic X-ray Scattering, Heavy-duty Eulerian goniometer tower | CRYOMECH 4K PT407 pulse tube cryorefrigerator, Furnace to 1400oC (planned), Diamond anvil cells (planned), Cryomagnet (planned), Various sample chambers | |
| BL12B2 | 5 ∼ 90keV (white), 5 ∼ 75keV(monochromatized) | 10-4 | 1010 ∼ 1012 photons/sec/meV below 26 keV | 0.25mm(V) ~ 0.25mm(H) | Ge solid-state detector, Scintillation Counters | for powder diffraction and high resolution x-ray scattering. Cryostat(6K) with precise carrier, Polarization chamber | |
| BL13XU | 5.5 ∼ 18.9keV | 10101013 ∼ 1014 photons/sec | multi axis diffractometer | for surface and interface structure analysis. Ultra high vacuum chamber | |||
| BL14B1 | 5.0 ∼ 90keV (Monochromatic) 5.0 ∼ 150keV (White) |
10-4 | 1010 photons/sec | 1mm ~ 1mm | Gas-flow type ion chamber (three) including the gas supply system for ion-chamber, Scintillation counter (25 Σ), Si solid-state detector | Cryostat for analyzing structure of single crystal in the temperature range from 10 to 300 K | |
| BL15XU | 500eV ∼ 60keV | 10-4 | > 1012 photons/sec (5 ∼ 20keV) | ∼ 0.8mm | Powder Diffractometer | ||
| BL16XU | 4.5 ∼ 40keV | 10-4 (< 10-3 over 20keV) | > 1012 photons/sec (normal 1mm beamsize), 109 photons/sec (focusing less than 1µm beam) | 1mm, < 1µm (focusing @ microbeam station) | 4-circle diffractmeter with an automatic software | ||
| BL19B2 | 8 ∼ 72keV | 10-4 (< 10-3 over 20keV) | 109 photons/sec | (horizontal beam divergence 1.4mrad) | powder diffractomerter, multi-axis diffractometer | ||
| BL22XU | 3 ∼ 70keV | 10-4 (< 10-3 over 20keV) | under evaluation | normal : 0.5 (V) ~ 3.2 (H), focusing: 0.5 (V) ~ 0.4 (H) @ 14.4keV | Diffractometer for diamond anvil cell, 2-circle diffractometer, 4-circle diffractometer | multi-anvil press (SMAP-180) | |
| BL24XU | 10-4 | 1012 photons/sec | < 1mm | 1. In-situ surface X-ray diffractometer for MOCVD with Z-axis diffractometer,
material sources delivering system for MOCVD growth and neutralization
system for exhausted gases (Surface/interface analysis during metal-organic
chemical vapor deposition) [NTT] 2. High precision multipurpose 6-axis X-ray diffractometer with supply and exhaust equipment for incombustible gases (Multipurpose industrial applications) [NIRO/Hyogo Science and Technology Association] |
|||
| BL28B2 | White (> 5 keV owing to the Be window) | 30 mm(H) ~ 10 mm(V) (at 44 m from a light source) | Vertical-axis Φ-2Ζ diffractometer, with a horizontal Τ-axis on the 2Ζ arm. Detector translation stage on the Τ goniometer. | Infrared Heater (up to 1770 K), Cryostat (3.8 K) | |||
| BL39XU | 5 ∼ 37keV | 2 ~ 10-4 | >4 ~ 1013 photons/sec | 0.6 mm(V) ~ 2 mm(H) | Two-axis diffractometer with polarization analyzer | Magnetic Scattering | |
| BL46XU | 5.2 ∼ 75keV | 10-4 | >4.6 ~ 1012 photons/sec | < 1mm2 | HUBER 5020 eight-axis difractometer, Ge solid state detector (Detectable area : 100 mm2), Scintillation counter, Gas flow type ion chamber | Cryostat: Built-in goniometer head, 15 ∼ 300 K | |
| Ritsumeikan Univ. SR Center | BL-1 | 5 ∼ 8kev |
| Facility | BL | X-ray energy or wavelength | Energy Resolution | Photon Flux | Beam Size at Sample | Diffractometer/Detector | Sample Conditions |
|---|---|---|---|---|---|---|---|
| PF | BL-6A | 0.9-1.3A | dE/E = 1~10-3 ∼ 5~10-4 | 2.5~109photons/s | 0.1 mm ~ 0.1 mm sample slit | ADSCΠ»Quantum4R | N2 gal cooling |
| BL-6B | 0.9-1.8A | 2.5~109photons/s | 0.2mm ~ 0.2mm or 0.1mm ~ 0.1mm sample slit | Weissenberg camera (IP) | |||
| BL-6C | 0.9-1.8A | 2.5~109 | 0.2mm ~ 0.2mm or 0.1mm ~ 0.1mm sample slit | Weissenberg camera (IP) | |||
| BL-10C | 5-10keV | E/dE = 3000 | 1011photons/sec | yfράv(¬pράv) PSPC/IP | Cooling water(-40`+150A}0.05) | ||
| BL-15A | 1.5A | ∼ 3 ~ 10-3 | ∼ 1 ~ 1011 photons/sec (depends on slit condition) | 0.5 mm(V) ~ 0.35 mm(H)@(theoretical) | for small angle x-ray scattering, Fast 1-d position sensitive x-ray detector | ||
| BL-18B | 0.5-2.0A | 4 ~ 1010 photons/s (2.5GeV 300mA, 0.4mm(V) 1.2mm(H), 1A) | 0.4mm(V) ~ 0.5mm(H) | Weissenberg/Laue Camera | |||
| AR (PF) | AR-NW12A | ||||||
| SPring-8 | BL12B2 | 5 ∼ 90keV (white), 5 ∼ 75keV(monochromatized) | 10-4 | 1010 ∼ 1012 photons/sec/meV below 26 keV | 0.25mm(V) ~ 0.25mm(H) | ADSC Quantum 4R CCD detector, Image plate, AMPTEK x-ray detectors for MAD | |
| BL24XU | 10-4 | 1012 photons/sec | < 1mm | A diffractometer with two types of detectors (an imaging plate area detector [Rigaku R-AXIS V] and a CCD camera [Rigaku Jupiter 210]), a kappa-goniometer, and a cryo-cooling system (Structural analysis of small bio-crystals for industry) [Hyogo Science and Technology Association] | |||
| BL26B1/B2 | 6 ∼ 17keV | 10-4 | 1011 photons/sec @ 12keV | < 1mm | 2 ~ 2 Mosaic CCD Detector, Imaging Plate Detector | sample changer | |
| BL32B2 | 6 ∼ 17keV | 10-4 | 1010 photons/sec | 0.2mm ~ 0.2mm | CCD Jupiter210 (Rigaku/MSC): 2 ~ 2 array of detector modules, a total
active area of 210 mm ~ 210 mm and 51 µm pixels. Imaging Plate detector for structural biology ( R-AXIS V ++ ( Rigaku )): Total active area of 400 mm ~ 400 mm and 100 µm pixels. Horizontal kappa-type goniometer |
Cryostat (Nitrogen type) : temperature control range 80 ∼ 350 K | |
| BL40XU | 8 ∼ 17keV | ∼ 2% | 1.5 ~ 1015 photons/sec | Time resolved X-ray scattering/diffraction | |||
| BL40B2 | 7 ∼ 18keV | 10-4 | 1011 photons/sec @ 12keV | Protein Crystallography, Small angle scattering | |||
| BL41XU | 6.5 ∼ 17.5, 19 ∼ 37 keV | 2 ~ 10-4, < 10-3 over 20keV | 1013 photons/sec | 0.1mm | Protein Crystal Diffractometer | ||
| BL44XU | 9 ∼ 16keV | 2 ~ 10-4 | 1012 photons/sec | 100µm(H) ~ 300µm(V) (FWHM) | Oscillation/Still Camera | ||
| BL44B2 | 6 ∼ 30keV | 10-4 | 1012 photons/sec in 0.1%b.w.(@20keV, monochromatic) 1015 photons/sec (7 ∼ 30keV)(white) |
On-line CCD detector : detector area Σ165 mm, Scintillation counter for the measurement of absorption edge, High speed X-ray shutters | Cryostat : temperature control range 20 ∼ 375K, Pulse Nd: YAG laser, Dye laser | ||
| BL45XU | 10-4 | Protein Crystallography with trichromator, small angle scattering |