| Facility | BL | X-ray Energy | Energy Resolution | Photon Flux | Beam Size at Sample | Methods |
|---|---|---|---|---|---|---|
| PF | BL-4A | White/Monochromatic 5 keV - 30 keV | ΔE/E ∼ 10-4 | 1011photons/s (max., monochromatic) | 40mm(h)×3mm(v) (non-focusing), 1mm(h)×3mm(v) (saggital focusing), 5µm×5µm (microbeam) | Point/Mapping, chemical state mapping, TRXRF, WDX |
| SPring-8 | BL08W | 120 ∼ 150keV | < 10-3 | 1 × 1013 photons/s (@100keV) | 1mm (H) × 2mm (W) | EDX (Ge SSD) |
| BL16XU | 4.5 ∼ 40keV | 10-4 (< 10-3 over 20keV) | > 1012 photons/sec (normal 1mm beamsize), 109 photons/sec (focusing less than 1µm beam) | 1mm, < 1µm (focusing @ microbeam station) | WDX (normal beamsize, TRXRF), EDX (microbeam) | |
| BL24XU | 10-4 | 1012 photons/sec | < 1mm | Surface/interface analysis of metallic materials for industry (fluorescent X-ray analysis and others) | ||
| BL37XU | 5 ∼ 37keV, 75.5keV | 2 × 10-4 | 1012 ∼ 1013 photons/sec | 1mm(V) × 3mm(H) | EDX, TRXRF, microbeam | |
| BL40XU | 8 ∼ 17keV | ∼ 2% | 1.5 × 1015 photons/sec | |||
| Ritsumeikan Univ. SR Center | BL-3 | 2 ∼ 10kev |
note: